Making accurate phase noise and Allan deviation measurements has never been easier or more cost effective. The all-digital 5115A High-Performance Phase Noise and Allan Deviation (ADEV) Test Set transforms the way these measurements are made. Traditional analog measurement instruments require an external phase-lock loop, turning these types of measurements into a complicated and costly endeavor. Compare this to the innovative 5115A, which makes fast yet accurate single sideband (SSB) phase noise and ADEV measurements at the click of a button, all at a fraction of the cost of alternative solutions.
Microsemi's 5115A is the easiest to use phase noise and ADEV test set in the world: simply connect the device under test (DUT) and a reference signal (which can be at a different frequency than the DUT) and press the 5115A’s green Start button. Seconds later valid measurement data appears on the unit’s high resolution display. With the all-digital 5115A, tedious multi-step configuration and calibration routines are no longer required.
•Simultaneous Phase Noise and Allan Deviation Measurements
•1 - 30 MHz Frequency Range
•Measurement Results Displayed within Seconds
•Industry Leading Accuracy (±1.0 dB)
•Supports Measurements with Input and Reference at Different Frequencies
•Allan Deviation Measurements (to over 300 Days)
• Phase Noise Measurements as Close as 0.1 mHz from the Carrier
•No Measurement Calibration Required
•Real-time Noise Floor Displayed
•Intuitive Remote Network Management and Data Acquisition
•Easy to Use Graphical User Interface
•Phase Noise Measurements Down to -147 dBc/Hz