High-Performance Phase Noise and Allan Deviation Test Set with Ultra Low Noise Floorline (5120A)
Making accurate phase noise and Allan deviation measurements has never been easier or more cost effective. The all-digital 5120A High-Performance Phase Noise and Allan Deviation (ADEV) Test Set with Ultra Low Noise Floor transforms the way these measurements are made. Traditional measurement instruments require an external phase-lock loop, turning these types of measurements into a complicated and costly endeavor. Compare this with the 5120A, which makes fast yet accurate single sideband (SSB) phase noise and ADEV measurements at the click of a button, all at a fraction of the cost of alternative solutions.
The Microsemi 5120A is easy to use: simply connect the device under test (DUT) and reference signal (which can be at a different frequency than the DUT) and press the 5120As Start button. Seconds later valid measurement data appears on the units high resolution display. With the all-digital 5120A, tedious multi-step configuration and calibration routines are no longer required.
Simultaneous phase noise and Allan Deviation measurements
1-30 MHz frequency range
Industry leading accuracy (±1.0 dB)
Allan Deviation measurements(to over 300 days)
Phase noise measurements as close as 0.1 mHz from the carrier
Real-time noise floor displayed
Optional internal reference oscillator
Intuitive remote network management and data acquisition
Phase noise measurements down to- 175 dBc/Hz