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Phase Noise Test Probe



Phase Noise Test Probe (3120A)

The Microsemi developed direct digital phase noise measurement technique has been extended to a test probe. Making accurate phase noise and Allan deviation measurements has never been more cost effective. The programmable high performance Microsemi 3120A Phase Noise Test Probe measures the amplitude, phase and frequency stability of RF sources and two-port devices at frequencies from 0.5 MHz to 30 MHz.

Features
Independent input and reference frequencies from 0.5 MHz to 30 MHz
Cross-correlated measurements of PM noise at offsets from 1 Hz to 100 kHz
Allan deviation (ADEV) typically less than 1E-13 at t=1s
SFDR specified at -100 dBc, typically below -120 dBc
Frequency and phase difference graphs depict oscillator drift with 1 million+ point records
Includes digital I/O expansion port and independent access to input ADCs
Easy-to-use measurement software, fully multithreaded for high performance
Straightforward ASCII file format with flexible data import/export options

Data Sheet:
DS3120A1.pdf


Microsemi